About Us

Probion Analysis is an independent European company founded in 1998 near Paris,
specializing in the analysis of semiconductor, metallic, and insulating samples for industry
and research.

Experts in SIMS analysis (Secondary Ion Mass Spectrometry), we provide precise material
characterization through elemental composition, dopant and contaminant profiles (ppm–ppb)
across all common materials (Si, SiO₂, Ge, C, SiC, III-V, and II-VI), as well as in emerging
materials and multilayer structures associated with microelectronic components and
integrated circuits.

We also handle requests for all types of solids, including metallic alloys, glasses, and
coatings.

With a broad range of complementary analytical tools at our disposal (XPS, ECV profiler,
TOF-SIMS, RBS, FIB-TEM), we evaluate your analytical challenges and provide the most
suitable solutions to give you the reliable information.